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Corresponding Author

Marwa M. Ebida

Document Type

Original Study

Abstract

Purpose: To evaluate the effect of Low-Level Laser Therapy (LLLT) on the peri-implant probing depth and plaque index of mandibular implant-retained overdentures. Subjects and Methods: Ten completely edentulous patients were selected and rehabilitated using maxillary complete dentures and mandibular overdentures supported by two implants in the canine area. The groups were represented by the implants as follows; Group I: Right implant in each patient was the control group and was not subjected to LLLT; Group II: Left implant in each patient was the study group and was subjected to six LLLT Semi-conductor diode laser sessions. The evaluation was made for probing depth (PD) around implants and plaque index (PI) immediately after denture loading (baseline), after one month, and then after three months. Results: There was a non-significant difference in PD, and PI (P< 0.05) between the two implant groups, but group Ⅱ implants showed lower PD and PI values than group Ⅰ implants. Conclusion: The application of LLLT on implants decreases the peri-implant probing depth and plaque index than in implants without LLLT.

Keywords

Implant, low-level laser therapy, probing depth, and plaque index.

Subject Area

Restorative Dentistry Issue (Removable Prosthodontics, Fixed Prosthodontics, Endodontics, Dental Biomaterials, Operative Dentistry)

Included in

Dentistry Commons

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